The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2011

Filed:

Mar. 10, 2006
Applicants:

Yukio Arima, Osaka, JP;

Toru Iwata, Osaka, JP;

Makoto Miyake, Osaka, JP;

Takefumi Yoshikawa, Hyogo, JP;

Inventors:

Yukio Arima, Osaka, JP;

Toru Iwata, Osaka, JP;

Makoto Miyake, Osaka, JP;

Takefumi Yoshikawa, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phase comparison process in a timing recovery process for high-speed data communication defines a data window and compares the phase of a clock in the window with the phase of an edge of data so as to realize a parallel process, wherein the phase comparison and the process of determining whether a data edge lies within the window are performed in parallel to each other, and the phase comparison result is output only if the data edge lies within the window. With this configuration, it is possible to perform an accurate phase comparison process with no errors without requiring high-precision delay circuits.


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