The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Apr. 06, 2005
Applicant:
Steven D. Millman, Gilbert, AZ (US);
Inventor:
Steven D. Millman, Gilbert, AZ (US);
Assignee:
Freescale Semiconductor, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for bit eye center determination is provided. In general, the system samples an incoming data stream to determine where transitions in the data stream occur, selectively offsets the selected samples based on state criteria and the number of transitions in each set of samples, accumulates the offset samples and averages the result to determine the center of the bit eye. The system and method also provides the ability to locate the eye center even in the case of noise in the system, whether the noise is random or deterministic, including odd/even noise.