The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Jun. 14, 2007
Shinichi Hamaguchi, Hyogo, JP;
Naoki Nakanishi, Shiga, JP;
Tatsuya Nakamori, Okayama, JP;
Naoto Shimada, Hyogo, JP;
Shinichi Hamaguchi, Hyogo, JP;
Naoki Nakanishi, Shiga, JP;
Tatsuya Nakamori, Okayama, JP;
Naoto Shimada, Hyogo, JP;
Panasonic Corporation, Osaka, JP;
Abstract
The optical pickup device according to the present invention includes: a light source which emits light at first, second and third wavelengths; an optical path combining unit which combines vectors of the light at the first, second and third wavelengths which is emitted by the light source, and matches optical axes of the light at the first wavelength and the light at the third wavelength; a light condensing unit which condenses the light from the optical path combining unit onto the optical information storage medium; a diffraction element which diffracts light at the first, second and third wavelength which is reflected from the optical information storage medium, in a first direction and a second direction respectively; a first photo detector which receives light at the first, second and third wavelength that is diffracted in the first direction by the diffraction element; a second photo detector which receives light at the first and third wavelength that is diffracted in the second direction by the diffraction element; and a third photo detector which receives light at the second wavelength that is diffracted in the second direction by the diffraction element.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile