The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2011

Filed:

Dec. 17, 2007
Applicants:

Akinori Araya, Yokohama, JP;

Tatsuo Nakata, Hino, JP;

Makio Ueno, Nagano, JP;

Inventors:

Akinori Araya, Yokohama, JP;

Tatsuo Nakata, Hino, JP;

Makio Ueno, Nagano, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is possible to achieve a required field number and numerical aperture for microscope observation at a scanning speed equal to video-rate or higher and also to change the scanning speed with a simple configuration. The invention provides a laser microscope including a laser light source; a scanning unit configured to scan a specimen with laser light emitted from the laser light source; and an objective lens configured to focus the laser light scanned by the scanning unit on the specimen. The scanning unit is provided with an electro-optical deflecting element including an electro-optical crystal in which a refractive index gradient is induced by injecting electric current.


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