The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Apr. 28, 2006
Applicants:
Daniel L. Marks, Urbana, IL (US);
Paul Scott Carney, Champaign, IL (US);
Inventors:
Daniel L. Marks, Urbana, IL (US);
Paul Scott Carney, Champaign, IL (US);
Assignee:
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A near-field microscope using one or more diffractive elements placed in the near-field of an object to be imaged. A diffractive covers the entire object, thus signal may thereby be gathered from the entire object, and advantageously increase the signal-to-noise ratio of the resulting image, as well as greatly improve the acquisition speed. Near-field microscopy overcomes the limitation of conventional microscopy in that subwavelength and nanometer-scale features can be imaged and measured without contact.