The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2011

Filed:

Jun. 23, 2009
Applicants:

Kazuhiro Akatsu, Ibaraki, JP;

Yasuyuki Shibayama, Ibaraki, JP;

Takeshi Mochizuki, Ibaraki, JP;

Inventors:

Kazuhiro Akatsu, Ibaraki, JP;

Yasuyuki Shibayama, Ibaraki, JP;

Takeshi Mochizuki, Ibaraki, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 15/14 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an optical scanning device including a light source including multiple light-emitting elements, the multiple light-emitting elements being arranged in a linear manner, a collimator lens to collimate a light beam from the light source, a light-deflecting device to deflect a light beam having passed through the collimator lens to a medium to be scanned and scan the medium with the light beam, and a rear optical system arranged in an optical path between the collimator lens and the medium to be scanned, wherein the collimator lens deviates an image surface in a direction opposite to an image surface deviation on the medium to be scanned by a nearly same amount as the image surface deviation, the image surface deviation being caused by a change of an image height of the light source, and the change being caused by the rear optical system.


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