The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2011

Filed:

Dec. 19, 2008
Applicant:

Byung Soo Eun, Seoul, KR;

Inventor:

Byung Soo Eun, Seoul, KR;

Assignee:

Hynix Semiconductor Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 31/062 (2006.01);
U.S. Cl.
CPC ...
Abstract

A trench isolation structure in a semiconductor device is provided. A semiconductor substrate has cell regions and peripheral circuit regions. First trenches have a predetermined depth and are formed in the semiconductor substrate at the cell regions. A first sidewall oxide film is formed overlying the first trenches. A first liner nitride film is formed overlying the first sidewall oxide film. Second trenches have a predetermined depth and are formed in the semiconductor substrate at the peripheral circuit regions. A second sidewall oxide film is formed overlying the second trenches. An oxide film fills the first overlying second trenches. A second liner nitride film formed on the filling oxide film. The second liner nitride film is separated from the sidewalls of the first and second trenches.


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