The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Dec. 20, 2007
Chih-kuang Chang, Taipei Hsien, TW;
Zhong-kui Yuan, Shenzhen, CN;
Yan-li LI, Shenzhen, CN;
LI Jiang, Shenzhen, CN;
Chih-Kuang Chang, Taipei Hsien, TW;
Zhong-Kui Yuan, Shenzhen, CN;
Yan-Li Li, Shenzhen, CN;
Li Jiang, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A method for scanning and measuring points of an object is provided. The method includes: (a) selecting a measuring start point and a measuring end point from an image of the object; (b) controlling a laser to move and scan the object from the measuring start point to the measuring end point with a predetermined distance according to X-axis coordinate values and Y-axis coordinate values of the measuring start point and the measuring end point to obtain scanned measuring points; (c) obtaining a vertical distance between each of the scanned measuring points and the laser; and (d) computing measuring results, namely computing a Z-axis coordinate value of each of the scanned measuring points according to the corresponding vertical distance. A related system is also provided.