The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Apr. 20, 2007
Johannes Arnoldus Laurentius Van Kan, Rhenen, NL;
Arjen Ten Have, Mar del Plata, AR;
Willem Hendrik Lindhout, Wageningen, NL;
Hendrikus Johannes Finkers, Wageningen, NL;
Remco Van Berloo, Wageningen, NL;
Adriaan Willem Van Heusden, Wageningen, NL;
Johannes Arnoldus Laurentius van Kan, Rhenen, NL;
Arjen ten Have, Mar del Plata, AR;
Willem Hendrik Lindhout, Wageningen, NL;
Hendrikus Johannes Finkers, Wageningen, NL;
Remco van Berloo, Wageningen, NL;
Adriaan Willem van Heusden, Wageningen, NL;
Monsanto Invest N.V., Amstelveen, NL;
Abstract
The present invention relates to a method for detecting a quantitative trait locus (QTL) associated with resistance toin tomato, including the steps of crossing a-resistant donor tomato plant with a non-resistant, or-susceptible, recipient tomato plant, contacting one or more offspring plants with an infective amount of, quantitatively determining the disease incidence and/or the rate of lesion growth in the one or more offspring plants, establishing a genetic linkage map that links the observed disease incidence and/or rate of lesion growth to the presence of chromosomal markers of the donor tomato plant in the one or more offspring plants, and assigning to a QTL the contiguous markers on the map that are linked to a reduced disease incidence and/or a reduced lesion growth rate.