The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Mar. 22, 2010
Ulrich Sander, Rebstein, CH;
Ulrich Sander, Rebstein, CH;
Leica Microsystems (Schweiz) AG, Heerbrugg, CH;
Abstract
A microscope and a method for illuminating an object to be imaged by a microscope are described. The method includes illuminating the object by primary light of a first spectral intensity distribution and by secondary light of a second spectral intensity distribution, the secondary light arising from the scattering of the primary light; measuring the intensity of at least one wavelength of the secondary light; comparing at least one of the measured intensity and a value derived from this measured intensity to a threshold value; and generating a signal indicating a change in the spectral intensity distribution of the secondary light by indicating whether the at least one of the measured intensity and value derived from this measured intensity either exceed or stay below the predefined threshold value.