The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Dec. 06, 2006
Peter William Lorraine, Niskayuna, NY (US);
Donald Robert Howard, Troy, NY (US);
Harry Israel Ringermacher, Delanson, NY (US);
Marc Dubois, Keller, TX (US);
Thomas E. Drake, Fort Worth, TX (US);
Peter William Lorraine, Niskayuna, NY (US);
Donald Robert Howard, Troy, NY (US);
Harry Israel Ringermacher, Delanson, NY (US);
Marc Dubois, Keller, TX (US);
Thomas E. Drake, Fort Worth, TX (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
An inspection system is provided to examine internal structures of a target material. This inspection system includes a generation laser, an ultrasonic detection system, a thermal imaging system, and a processor/control module. The generation laser produces a pulsed laser beam that is operable to induce ultrasonic displacements and thermal transients at the target material. The ultrasonic detection system detects ultrasonic surface displacements at the target material. The thermal imaging system detects thermal transients at the target material. The processor analyzes both detected ultrasonic displacements and thermal imagery of the target material to yield information about the target material's internal structure.