The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2011
Filed:
Apr. 25, 2007
Lars Montelius, Bjärred, SE;
Sara Ghatnekar-nilsson, Lund, SE;
Lars Montelius, Bjärred, SE;
Sara Ghatnekar-Nilsson, Lund, SE;
Nems AB, Lund, SE;
Abstract
The present invention relates to an arrangement () for detection of a first resonance frequency (F), related to a mass (') loaded carrier means (), and to compare said first resonance frequency (F) with a second, as a reference used, resonance frequency (F), related to said carrier means (), by using frequency comparing and/or calculating means () to evaluate, by a noted frequency shift (F-F), a mass weight (′). An array of individual carrier means () are arranged adjacent to each other, that one or more of said carrier means are allotted different second resonance frequencies, that received resonance frequencies (F) from said loaded carrier means are received and/or evaluated simultaneously, or at least essentially simultaneously, in a signal receiving and/or processing unit () and that said first resonance frequencies (F) are compared and/or calculated within said calculating means () with corresponding resonance frequencies (F) stored in said unit () in a memory () thereof.