The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
Oct. 13, 2006
Trevor Anderson, Northcote, AU;
Sarah Dods, Box Hill North, AU;
Adam Kowalczyk, Glen Waverly, AU;
Justin Bedo, Victoria, AU;
Kenneth Paul Clarke, Glen Iris, AU;
Trevor Anderson, Northcote, AU;
Sarah Dods, Box Hill North, AU;
Adam Kowalczyk, Glen Waverly, AU;
Justin Bedo, Victoria, AU;
Kenneth Paul Clarke, Glen Iris, AU;
National ICT Australia Limited, Eveleigh, New South Wales, AU;
Abstract
A method of assessing a signal to identify particular signal characteristics comprises application of machine learning to multi-dimensional histograms derived from multi-tap sampling of the signal. The signal is sampled from at least two tap points to retrieve a sample set, and the at least two tap points are adapted to retrieve distinct samples from the signal, such as time spaced samples or spectrally distinct samples. Multiple sample sets are retrieved from the signal over time. The at least two dimensional histogram is built from the joint probability distribution of the plurality of sample sets. A machine learning algorithm then processes the multi-dimensional histogram, and is trained to predict a value of at least one characteristic of the signal.