The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
Nov. 09, 2005
Dietmar Spanke, Steinen, DE;
Edgar Schmitt, Friesenheim, DE;
Holger Steltner, Esslingen, DE;
Alexey Malinovskiy, Lörrach, DE;
Dietmar Spanke, Steinen, DE;
Edgar Schmitt, Friesenheim, DE;
Holger Steltner, Esslingen, DE;
Alexey Malinovskiy, Lörrach, DE;
Endress + Hauser GmbH + Co. KG, Maulburg, DE;
Abstract
An improved and more accurate method for evaluating and correcting total measurement signals (TS(n)) of measuring devices. The invention concerns a method for evaluating and correcting total measurement signals (TS(n)) of a measuring device, wherein measuring signals are transmitted in the direction of a medium and reflected on a surface of the medium as wanted echo signals or on a surface of a disturbing element as interference signals and received. In the case of a modification of at least one technical, process condition in the container and/or a modification of at least one technical, measurement condition of the measuring device, an independent reference curve is ascertained on the basis of a current static reference curve, wherein the interference signals are masked out of the raw echo curve on the basis of a masking algorithm, which applies the independent reference curve.