The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
Jun. 30, 2009
Yibin Tian, Menlo Park, CA (US);
Wei Ming, Cupertino, CA (US);
Yibin Tian, Menlo Park, CA (US);
Wei Ming, Cupertino, CA (US);
Konica Minolta Systems Laboratory, Inc., San Mateo, CA (US);
Abstract
A document alteration detection method compares a target image with an original image using a two-step process. In the first step, the original and target images are divided into connected image components and their centroids are obtained, and the centroids of the image components in the original and target images are compared. Each centroid in the target image that is not in the original image is deemed to represent an addition, and each centroid in the original image that is not in the target image is deemed to represent a deletion. In the second step, sub-images containing the image components corresponding to each pair of matching centroids in the original and target images are compared to detect any alterations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile