The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
May. 14, 2007
Hirohisa Nishino, Tokyo, JP;
Masahiko Uno, Tokyo, JP;
Hirohisa Nishino, Tokyo, JP;
Masahiko Uno, Tokyo, JP;
Mitsubishi Electric Corporation, Chiyoda-Ku, Tokyo, JP;
Abstract
The method comprises a first step (Sin FIG.) of obtaining a transmission image, a second step (S) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S) and the binarized image stored at the fourth step (S), and a sixth step (S) of deciding the quality of the object to-be-inspected from the binary feature quantities.