The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
Dec. 27, 2007
Hiroya Kakimoto, Gunma, JP;
Fuyuki Miyazawa, Gunma, JP;
Mitsuo Sekiguchi, Gunma, JP;
Katsuhiro Oyama, Takasaki, JP;
Hiroya Kakimoto, Gunma, JP;
Fuyuki Miyazawa, Gunma, JP;
Mitsuo Sekiguchi, Gunma, JP;
Katsuhiro Oyama, Takasaki, JP;
Taiyo Yuden Co., Ltd., Tokyo, JP;
Abstract
Novel evaluation indexes are introduced to allow both a total evaluation of data recording and an evaluation of individual detection patterns. A data recording evaluation method includes a step of reproducing a result of data recording performed on an optical disk and identifying a predetermined detection pattern in a reproduction signal, a step of detecting a signal state of the reproduction signal associated with the predetermined detection pattern, and a first calculation step for calculating a first evaluation index value based on the detected signal state and a reference state identified from the predetermined detection pattern. When there is a plurality of predetermined detection patterns as described above, a second calculation step is further provided for calculating a second recording state evaluation index value using the first evaluation index value calculated from each of the predetermined detection patterns. Data recording can be properly evaluated using the first and second recording state evaluation index values.