The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2011

Filed:

Dec. 23, 2009
Applicant:

Atsushi Yonetani, Ina, JP;

Inventor:

Atsushi Yonetani, Ina, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope objective includes at least five lens components, which are divided into three groups that are, in order from an object side: a front group having a positive refracting power as a whole and having a meniscus lens component with an object-side surface thereof being concave toward the object side; a middle group having a positive refracting power as a whole and having a plurality of cemented lens components; and a rear group having a pair of concave air-contact surfaces arranged adjacent and opposite to one another, wherein the following conditions are satisfied: 3≦D/f≦6 and 1≦H/H≦1.5, where Dis an axial distance from an object surface to a rearmost surface of the microscope objective, f is a focal length of the microscope objective, His a height of a marginal ray as emergent from the rearmost surface of the microscope objective, and His a maximum height of the marginal ray as passing through the front group and the middle group.


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