The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
Apr. 26, 2006
Georg Fehrenbacher, Muehltal, DE;
Georg Fehrenbacher, Muehltal, DE;
GSI Helmholtzzentrum Fuer Schwerionenforschung GmbH, Darmstadt, DE;
Abstract
A method of spectrometric photon dosimetry for integrally and nuclide-specifically determining a gamma dose rate for X-ray and gamma radiation. The method includes measuring a spectrum in at least one energy group or at least one interval group. The pulse height distribution is with a spectrometer and a pulse height analyzer. The number of channels of the spectrometer is such that a map of the pulse height distribution at a requisite resolution over an energy can be made. The measured pulse height distribution is converted into a photon spectrum using a deconvolution procedure that uses response functions having the same energy resolution as the pulse height distribution. The dose spectrum is calculated using dose conversion factors that are energy-dependent and related to the mean energy of a respective corresponding energy interval. The integral dose or dose rate is determined by summing the dose spectrum. The spectrometer is switched to a low-resolution mode of operation in order to ascertain an integral dose rate and switched to a high-resolution mode of operation in order to analyze radiation sources for which nuclides that cause higher dose rates are to be identified.