The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2011

Filed:

Jun. 24, 2004
Applicants:

Kazunori Mototsu, Kobe, JP;

Seido Biwa, Kobe, JP;

Inventors:

Kazunori Mototsu, Kobe, JP;

Seido Biwa, Kobe, JP;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 33/48 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample analyzer includes a loading section in which a measuring unit is removably set, the measuring unit being adapted to receive a sample; and a control section which analyzes a signal acquired from the sample received in the measuring unit set in the loading section to provide a result of analysis of the sample; wherein the control section judges whether or not the measuring unit is properly set in the loading section.


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