The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2011
Filed:
Jan. 20, 2009
James Zhengshe Liu, Glenview, IL (US);
John Lamberty, Oconomowoc, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Langler, Brookfield, WI (US);
James Zhengshe Liu, Glenview, IL (US);
John Lamberty, Oconomowoc, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Langler, Brookfield, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A gain correction and calibration technique for digital imaging systems is provided. In one embodiment, a method may include acquiring a plurality of dark images via a digital detector of an X-ray system. Acquiring the plurality of dark images may include acquiring data from a plurality of data channels of the digital detector during an analog test mode of the digital detector in which calibration voltages are applied to the data channels. The method may also include calibrating a channel gain map of the detector based on the plurality of dark images. Additional systems, methods, and devices are also disclosed.