The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Apr. 13, 2007
Douglas Neil Kimelman, Winnipeg, CA;
Marsha Kimelman, Winnipeg, CA (US);
David Peter Mandelin, Berkeley, CA (US);
Daniel M. Yellin, Gimmel, IL (US);
Douglas Neil Kimelman, Winnipeg, CA;
Marsha Kimelman, Winnipeg, CA (US);
David Peter Mandelin, Berkeley, CA (US);
Daniel M. Yellin, Gimmel, IL (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for determining a mapping between a first artifact and a second artifact, each artifact comprising at least one constituent, each at least one constituent comprising at least one feature, wherein each at least one feature is selected from a feature group consisting of: a relationship feature and a characteristic feature, the mapping comprising at least one constituent match comprising a correspondence between the at least one constituent of the first artifact and the at least one constituent of the second artifact, the method includes acts or steps of: a) receiving as input the first and second artifacts, and a description of the artifacts, constituents, and the features of the constituents; b) performing advanced inexact matching, comprising a step of selecting the mapping, the mapping comprising the at least one constituent match; and c) producing as output the mapping determined from the step of performing advanced inexact matching.