The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Jan. 24, 2008
Applicants:

Baojing Liu, San Jose, CA (US);

Matt Davidson, Mountain View, CA (US);

Vladimir Kovalev, Fremont, CA (US);

Inventors:

Baojing Liu, San Jose, CA (US);

Matt Davidson, Mountain View, CA (US);

Vladimir Kovalev, Fremont, CA (US);

Assignee:

SanDisk Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit chip includes a scan-in pin, a scan clock pin, and a test controller. The scan-in pin and the scan clock pin receive a test program for the type of test mode and a soft-reset pattern. A state machine is configured to direct sampling of a scan clock waveform provided through the scan clock pin as dictated by transitions of a scan-in waveform provided through the scan-in pin. The state machine identifies a bit match from the sampled scan clock waveform upon executing the soft-reset pattern. The identified bit match triggers a soft reset which eliminates the need for an extra reset pin, when testing in scan mode.


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