The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Jul. 12, 2007
Applicants:

Gerald G. Pechanek, Cary, NC (US);

David Carl Strube, Raleigh, NC (US);

Edwin Frank Barry, Cary, NC (US);

Charles W. Kurak, Jr., Durham, NC (US);

Carl Donald Busboom, Cary, NC (US);

Dale Edward Schneider, Durham, NC (US);

Nikos P. Pitsianis, Chapel Hill, NC (US);

Grayson Morris, Durham, NC (US);

Edward A. Wolff, Chapel Hill, NC (US);

Patrick R. Marchand, Apex, NC (US);

Ricardo E. Rodriguez, Raleigh, NC (US);

Marco C. Jacobs, Durham, NC (US);

Inventors:

Gerald G. Pechanek, Cary, NC (US);

David Carl Strube, Raleigh, NC (US);

Edwin Frank Barry, Cary, NC (US);

Charles W. Kurak, Jr., Durham, NC (US);

Carl Donald Busboom, Cary, NC (US);

Dale Edward Schneider, Durham, NC (US);

Nikos P. Pitsianis, Chapel Hill, NC (US);

Grayson Morris, Durham, NC (US);

Edward A. Wolff, Chapel Hill, NC (US);

Patrick R. Marchand, Apex, NC (US);

Ricardo E. Rodriguez, Raleigh, NC (US);

Marco C. Jacobs, Durham, NC (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/28 (2006.01); G06F 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Details of a highly cost effective and efficient implementation of a manifold array (ManArray) architecture and instruction syntax for use therewith are described herein. Various aspects of this approach include the regularity of the syntax, the relative ease with which the instruction set can be represented in database form, the ready ability with which tools can be created, the ready generation of self-checking codes and parameterized test cases. Parameterizations can be fairly easily mapped and system maintenance is significantly simplified.


Find Patent Forward Citations

Loading…