The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Nov. 16, 2007
Applicants:

Brian Brandenburg, Wake Forest, NC (US);

Randall A. Craig, Raleigh, NC (US);

Virginia D. Hill, Raleigh, NC (US);

Govindaraj Sampathkumar, Cary, NC (US);

Deanna M. Shaw, San Martin, CA (US);

Inventors:

Brian Brandenburg, Wake Forest, NC (US);

Randall A. Craig, Raleigh, NC (US);

Virginia D. Hill, Raleigh, NC (US);

Govindaraj Sampathkumar, Cary, NC (US);

Deanna M. Shaw, San Martin, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 17/30 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data for a first time period in a primary data sequence is compared with data for a second time period in each of a set of secondary data sequences. The durations of the first and second time periods are correlated, and the first time period is different from the second time period. A ranking is assigned to each secondary data sequence based on the corresponding data for the second time period. The ranking for each of the set of secondary data sequences is written to a computer useable medium. The primary data sequence and the set of secondary data sequences are adjusted based on a request to change the primary data sequence to one of the set of secondary data sequences. The comparing, assigning, and writing are repeated for the adjusted primary data sequence and set of secondary data sequences.


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