The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Jan. 31, 2008
Naohiko Matsuo, Kobe, JP;
Hiroyuki Fujino, Kakogawa, JP;
Mitsuyo Koya, Kyoto, JP;
Susumu Hoshiko, Kobe, JP;
Naohiko Matsuo, Kobe, JP;
Hiroyuki Fujino, Kakogawa, JP;
Mitsuyo Koya, Kyoto, JP;
Susumu Hoshiko, Kobe, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A sample analyzer optically measures reaction of a sample mixed with reagent, and obtains optical information therefrom; generates a reaction curve representing change in the optical information over time; determines a first area prior to an evaluation target time (t) and a second area after the evaluation target time (t) wherein the first and second areas are formed between a baseline which is parallel to the time axis and a reaction curve from a first time (t) prior to the optional evaluation target time (t) to a second time (t) after the evaluation target time, and determines the reaction end point based on the first and second areas; and obtains a characteristic of a sample based on the determined reaction end point, is disclosed. a sample analyzing method is also disclosed.