The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Apr. 17, 2007
Applicants:

Takeshi Onishi, Kanagawa, JP;

Takashi Sonoda, Kanagawa, JP;

Inventors:

Takeshi Onishi, Kanagawa, JP;

Takashi Sonoda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing apparatus includes an image acquisition section, a combination detection section and an angle detection section. The image acquisition section acquires a code pattern image from a surface of a recording medium on which the code pattern is formed. In the code pattern, N unit images are selectively placed in M reference positions that are arranged at predetermined intervals in two directions orthogonal to each other where M≧4 and 2≦N<M. The combination detection section detects pairs of the unit images based on the predetermined intervals and respective positions of the unit images contained in the code pattern image acquired. The angle detection section detects a rotation angle of the code pattern image with respect to a predetermined reference axis based on an inclination of a line, with respect to the predetermined reference axis, connecting the unit images of each pair detected.


Find Patent Forward Citations

Loading…