The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Oct. 24, 2007
Sheng-peng Tseng, Shenzhen, CN;
Xiao-man Pu, Shenzhen, CN;
Sheng-Peng Tseng, Shenzhen, CN;
Xiao-Man Pu, Shenzhen, CN;
Ensky Technology (Shenzhen) Co., Ltd., Baoan District, Shenzhen, Guangdong Province, CN;
Ensky Technology Co., Ltd., Banqiao Dist., New Taipei, TW;
Abstract
A positioning measurement method is provided. The method includes the step of: capturing images of a standard object and to-be-measured objects; selecting one or more standard points from the image of the standard object; selecting a general location area and a standard area by taking each standard point as a reference point; generating a script for recording positions of each general location area and capturing a standard image in each standard area; storing the script into the data storage; determining the position of the general location area on the image of the to-be-measured object according to the position of general location area recorded in the script; and determining a measurement area, the image in the measurement area is most similar to the standard image within the general location area.