The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Nov. 29, 2007
Takashi Nakanishi, Tokyo, JP;
Shunsuke Mochizuki, Tokyo, JP;
Masahiro Yoshioka, Tokyo, JP;
Ryosuke Araki, Tokyo, JP;
Hiroto Kimura, Tokyo, JP;
Seiji Wada, Kanagawa, JP;
Hiroshi Ichiki, Kanagawa, JP;
Tetsujiro Kondo, Tokyo, JP;
Takashi Nakanishi, Tokyo, JP;
Shunsuke Mochizuki, Tokyo, JP;
Masahiro Yoshioka, Tokyo, JP;
Ryosuke Araki, Tokyo, JP;
Hiroto Kimura, Tokyo, JP;
Seiji Wada, Kanagawa, JP;
Hiroshi Ichiki, Kanagawa, JP;
Tetsujiro Kondo, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
A signal processing apparatus configured to process a signal transmitted via a transmission path where a waveform represented by a signal value of a particular symbol is stationarily distorted in accordance with values of symbols transmitted prior to the particular symbol, including the following elements: a receiving unit configured to receive a test signal which is the signal including symbols set to predetermined values via the transmission path; an obtaining unit configured to obtain the signal value of the particular symbol from the test signal received by the receiving unit; and a characteristic computing unit configured to compute a characteristic of distortion of the waveform represented by the signal value of the particular symbol in accordance with the values of the symbols transmitted prior to the particular symbol on the basis of waveforms represented by signal values obtained by the obtaining unit from a plurality of test signals.