The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Jul. 22, 2008
Applicants:
Shyh-kwei Chen, Chappaqua, NY (US);
Michail Vlachos, Tarrytown, NY (US);
Kun-lung Wu, Yorktown Heights, NY (US);
Philip Shi-lung Yu, Chappaqua, NY (US);
Inventors:
Shyh-Kwei Chen, Chappaqua, NY (US);
Michail Vlachos, Tarrytown, NY (US);
Kun-Lung Wu, Yorktown Heights, NY (US);
Philip Shi-lung Yu, Chappaqua, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods for the identification of correlated burst events among two or more data streams, given one or more specific query time spans are disclosed. Also broadly contemplated is the act of finding, from one or more data streams, those streams that have correlated burst events with another given data stream within a time span.