The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Mar. 05, 2009
Michael D. Tocci, Sandia Park, NM (US);
Michael D. Tocci, Sandia Park, NM (US);
Contrast Optical Design & Engineering, Inc., Sandia Park, NM (US);
Abstract
A system for simultaneously producing multiple images substantially identical images on multiple separate detector planes is disclosed. A reflective spatially beam-splitting element preferably comprising multiple reflective areas is preferably placed at a location substantially coincident with the pupil or aperture of the system. In non-diffraction limited systems, each area preferably comprises an actual cross section that is circular or has the rotational symmetry (or a multiple thereof) of the number of images to be formed. In diffraction limited systems, all of the areas preferably comprise actual cross sections that have the same shape, size and orientation with respect to the incoming optical beam. Each individual actual cross section may be due to the shape of each area, optionally in combination with a mask. Appropriate selection of filters enables real-time multi-spectral scientific imaging, imaging polarimetry, or high dynamic range imaging (HDRI) for photography and cinematography, even with a moving camera and/or moving subjects.