The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Oct. 23, 2008
Ulrich Sander, Rebstein, CH;
Ulrich Sander, Rebstein, CH;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
An assistant microscope add-on device for a surgical microscope () comprises an objective () inclined relative to an object plane () with an object field ('), wherein the objective defines an objective plane (′) and an objective axis (′) perpendicular thereto forming an angle α larger than 0° to the surface normal of the object plane (). A tube () and an eyepiece () having an eyepiece lens () defining an eyepiece plane (′) and an eyepiece axis () perpendicular thereto. Due to the oblique viewing angle, an intermediate image plane () to be imaged by the eyepiece () is inclined relative to the objective plane (′). The resulting aberration is eliminated by the eyepiece axis () and the objective axis (′) forming an angle β of larger than 0°, wherein the angle β is so chosen that the eyepiece axis () is substantially perpendicular to the intermediate image plane (). Consequently, the object field (′) is imaged free of distortion and sharply across the entire image area.