Pump probe measuring device and scanning probe microscope apparatus using the device

Abstract

A pump probe measuring device () includes an ultrashort optical pulse laser generator () for generating a first ultrashort optical pulse train, which becomes a pump light, and a second ultrashort optical pulse train, which becomes a probe light, a delay time adjusting unit () for adjusting a delay time between ultrashort optical pulse trains, a first pulse picker and a second pulse picker () for accepting each of the first and the second ultrashort optical pulse trains and allowing only one pulse to be transmitted at an arbitrary repetition periodicity, thus reducing the effective repetition frequency of the optical pulses, a delay time modulation unit () for periodically changing a position through which pulses are transmitted by the first and the second pulse pickers (), an irradiation optical system () for applying pump light and probe light to a sample (), a measuring unit () for detecting probe signals from a sample (), and a lock-in amplifier ().