The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Dec. 19, 2007
Applicant:
Jianhua Xu, Mill Creek, WA (US);
Inventor:
Jianhua Xu, Mill Creek, WA (US);
Assignee:
Microvision, Inc., Redmond, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for detecting scanner phase error in a bidirectional scanned beam imager includes obtaining first and second images derived from respective first and second scan directions, comparing apparent image feature positions in the first and second images, and calculating a phase error corresponding to a difference between the apparent image feature positions. The comparison may include multiplying frequency domain transformations of the images.