The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Jul. 04, 2007
Gereon Huettmann, Luebeck, DE;
Peter Koch, Luebeck, DE;
Gereon Huettmann, Luebeck, DE;
Peter Koch, Luebeck, DE;
Universitaet Zu Luebeck, Luebeck, DE;
Abstract
A method is provided for the electronic scanning of the intensity distribution of an optical interference pattern by means of a linear image sensor, wherein the interference pattern is produced by overlapping two temporally partly coherent beams striking at an arbitrarily predefined angle α in relation to one another and is provided with an interference strip having a carrier frequency greater than the scanning frequency, and amplitude modulation that can be varied slowly in relation to the pixel width, wherein at least one optical grating is disposed in the beam path of at least one of two incident beams and the image sensor is disposed in the diffraction image of the grating(s) such that, at the site of the image sensor, the beams interfere, and the beams enclose an angle β at the site of the image sensor, the angle being smaller than α.