The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Feb. 20, 2009
Applicant:

Georgios K. Konstadinidis, Santa Clara, CA (US);

Inventor:

Georgios K. Konstadinidis, Santa Clara, CA (US);

Assignee:

Oracle America, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for compensating negative bias temperature instability (NBTI) effects on a given model of transistors includes monitoring the NBTI effects on the transistors over time, determining a change in a threshold voltage of the transistors over time based on the monitoring, determining a forward bias voltage based on the change in threshold voltage, and applying the forward bias voltage to the transistors over time. The method may further include storing the monitoring results in a lookup table, and adjusting the forward bias voltage based on the lookup table. The monitoring may include emulating the NBTI effects on a system comprising a plurality of semiconductor devices in which the transistors are used.


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