The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Feb. 20, 2009
Takahiro Nakaminami, Osaka, JP;
Jin Muraoka, Osaka, JP;
Takahiro Nakaminami, Osaka, JP;
Jin Muraoka, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A measuring device () includes a base body () constituting: a sample holding portion () configured to hold a test sample containing urea and a material to be detected; and a sample supply port () through which the test sample is supplied to the sample holding portion (). The base body includes an optical measuring portion and a reagent holding portion () which are configured to carry out an optical measurement of the test sample held by the sample holding portion (). The reagent holding portion holds an antibody to the material to be detected and urease which causes hydrolysis of the urea. With this, the present invention provides a measuring device, a measuring apparatus, and a measuring method, each having a simple configuration and capable of reducing measurement errors caused by the urea contained in the test sample and accurately measuring the material to be detected.