The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Jun. 27, 2007
Applicants:

Wieslaw J. Roth, Sewell, NJ (US);

Thomas Yorke, Toms River, NJ (US);

Michael C. Kerby, Houston, TX (US);

Simon C. Weston, Annandale, NJ (US);

Inventors:

Wieslaw J. Roth, Sewell, NJ (US);

Thomas Yorke, Toms River, NJ (US);

Michael C. Kerby, Houston, TX (US);

Simon C. Weston, Annandale, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C01B 39/48 (2006.01); C01B 39/46 (2006.01); C10G 11/05 (2006.01); C10G 47/16 (2006.01); C10G 49/08 (2006.01); C10G 25/03 (2006.01); C07C 7/13 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to a crystalline molecular sieve having, in its as-synthesized form, an X-ray diffraction pattern including d-spacing maxima at 13.18±0.25 and 12.33±0.23 Angstroms, wherein the peak intensity of the d-spacing maximum at 13.18±0.25 Angstroms is at least as great as 90% of the peak intensity of the d-spacing maximum at 12.33±0.23 Angstroms. This invention also relates to a method of making thereof.


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