The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Aug. 27, 2010
Applicants:
Eniko Todorov Enikov, Tucson, AZ (US);
Gholam Peyman, Sun City, AZ (US);
Inventors:
Eniko Todorov Enikov, Tucson, AZ (US);
Gholam Peyman, Sun City, AZ (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system for measuring intraocular pressure (IOP) of an eye, comprising a plurality of force sensors that are adapted to contact a surface of an eye, means for measuring the forces exerted on the force sensors when in contact with the eye surface, and processing means that is adapted to receive the measured forces and determine IOP of the eye as a function of the measured forces.
Quick Actions:
Enikov, Eniko. (2011). Eye tonometry apparatus, systems and methods (U.S. Patent No. 7959570). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7959570
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile