The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2011

Filed:

Oct. 17, 2007
Applicants:

Mitsuaki Hagio, Fukuoka, JP;

Shin Osaki, Fukuoka, JP;

Keisuke Yoshino, Fukuoka, JP;

Inventors:

Mitsuaki Hagio, Fukuoka, JP;

Shin Osaki, Fukuoka, JP;

Keisuke Yoshino, Fukuoka, JP;

Assignee:

Kabushiki Kaisha Yaskawa Denki, Kitakyushu-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a preferred embodiment, an aligner includes a grip mechanism provided with a plurality of damp arms for holding an external periphery of a wafer; a rotary mechanism for rotating the grip mechanism to rotate the wafer in a prescribed rotational direction, and a lifter mechanism provided with a plurality of lift arms for lifting up the wafer above the grip mechanism. The aligner is configured to align the wafer by the grip operation of the grip mechanism and the rotary operation of the rotary mechanism, and one or more of the plurality of the lift arms which interfere with one or more of the plurality of clamp arms at the time of lifting up the plurality of lift arms are engaged with restriction members provided on the grip mechanism to prevent an upward movement thereof.


Find Patent Forward Citations

Loading…