The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2011
Filed:
Mar. 27, 2007
David G. Hunter, Wayland, MA (US);
Nadezhda V. Piskun, Sudbury, MA (US);
David G. Hunter, Wayland, MA (US);
Nadezhda V. Piskun, Sudbury, MA (US);
Children's Medical Center Corporation, Boston, MA (US);
Abstract
Generally, the present invention relates to medical devices and a method of vision screening, and more particularly to a pediatric vision screening system and method thereof that identifies a risk factor for amblyopia or diagnoses amblyopia by measurement of microstrabismus. An embodiment of the invention is directed to a method of patient screening for risk factors for amblyopia which includes the steps of illuminating the eye with polarized light, scanning the polarized light about the eye, capturing the retro-reflected light emanating back from the eye, analyzing the retro-reflected light to determine ocular misalignment; and calculating a metric to determine if the patient passes or fails the screening test thereby providing an indication that the patient may have a risk of amblyopia based on either strabismus or anisometropia. The method is effective at detecting amblyopia related to focusing problems without the measuring the focus of the eye directly.