The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Aug. 04, 2006
Christopher G. Cifra, Austin, TX (US);
Christopher G. Cifra, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for developing a measurement program that performs a measurement function. A measurement program is created in a development environment in response to first user input, possibly including configuring a physical unit under test (UUT) with one or more parameter values. The measurement program includes icons that visually indicate the measurement function, and is executable to receive signals from the physical (UUT). Second user input is received specifying that the measurement program is to receive simulated data instead of signals from the physical UUT. In response, the development environment is configured to provide the simulated data to the measurement program, possibly including configuring the simulated data according to the parameter value(s). The configuring does not change the measurement program. After the configuration, the measurement program is executed, where during execution the measurement program receives the simulated data and performs the measurement function on the simulated data.