The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Jan. 30, 2008
Tapan Chakraborty, Princeton Junction, NJ (US);
Chen-huan Chiang, Princeton Junction, NJ (US);
Suresh Goyal, Warren, NJ (US);
Michele Portolan, Blandshardstown, IE;
Bradford G. Van Treuren, Lambertville, NJ (US);
Tapan Chakraborty, Princeton Junction, NJ (US);
Chen-Huan Chiang, Princeton Junction, NJ (US);
Suresh Goyal, Warren, NJ (US);
Michele Portolan, Blandshardstown, IE;
Bradford G. Van Treuren, Lambertville, NJ (US);
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
The invention includes an apparatus and method for dynamically isolating a portion of a scan path of a system-on-chip. In one embodiment, an apparatus includes a scan path and control logic. The scan path includes at least a first hierarchical level, where the first hierarchical level includes a plurality of components, and a second hierarchical level having at least one component. The second hierarchical level is adapted for being selected and deselected such that the second hierarchical level is active or inactive. The control logic is adapted to filter application of at least one control signal to the at least one component of the second hierarchical level in a manner for controlling propagation of data within the second hierarchical level independent of propagation of data within the first hierarchical level. In one embodiment, when the second hierarchical level is deselected, the control logic prevents data from being propagated within the second hierarchical level while data is propagated within the first hierarchical level. In one embodiment, the second hierarchical level may be used for independent, parallel testing while data continues to be propagated through the first hierarchical level.