The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Jan. 24, 2007
Robert M. Lane, Auburn, CA (US);
Kenneth Tracton, Palo Alto, CA (US);
Zenon Fortuna, El Cerrito, CA (US);
Robert M. Lane, Auburn, CA (US);
Kenneth Tracton, Palo Alto, CA (US);
Zenon Fortuna, El Cerrito, CA (US);
Oracle America, Inc., Redwood City, CA (US);
Abstract
A Nyquist sampling frequency is determined for performance counter events to be measured. Based on the Nyquist sampling frequencies, a schedule for measuring the performance counter events is determined. The performance counter event measurements are then conducted in accordance with the schedule, whereby the measurements yield a set of sample data for each performance counter event. A signal reconstruction algorithm is applied to the set of sample data for each performance counter event to reconstruct an essentially complete signal for each performance counter event. The essentially complete signal for each performance counter event is then used to improve either a design or a utilization of either a microprocessor or an application to be executed on the microprocessor.