The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2011

Filed:

Jun. 27, 2007
Applicants:

Yusuke Mitarai, Tokyo, JP;

Masakazu Matsugu, Yokohama, JP;

Katsuhiko Mori, Kawasaki, JP;

Kan Torii, Pittsburgh, PA (US);

Hiroshi Sato, Kawasaki, JP;

Inventors:

Yusuke Mitarai, Tokyo, JP;

Masakazu Matsugu, Yokohama, JP;

Katsuhiko Mori, Kawasaki, JP;

Kan Torii, Pittsburgh, PA (US);

Hiroshi Sato, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plurality of pieces of learning data, each associated with a class to which the piece of the learning data belong, are input. In each piece of the learning data, a statistical amount of attribute values of elements in each of specific k parts, k being equal to or larger than 1, is calculated. Each piece of the learning data is mapped in a k-dimensional feature space as a vector having the calculated k statistics amounts as elements. Based on each piece of the mapped learning data and the classes to which the pieces of learning data belong, parameters for classifying input data into one of the plurality of classes are learned in the k-dimensional feature space. By using the parameters, pattern classification can be performed with high speed and high accuracy.


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