The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Apr. 25, 2007
Xi Long, Seattle, WA (US);
W. Louis Cleveland, New York, NY (US);
Y. Lawrence Yao, New York, NY (US);
Xi Long, Seattle, WA (US);
W. Louis Cleveland, New York, NY (US);
Y. Lawrence Yao, New York, NY (US);
Trustees of Columbia University in the City of New York, New York, NY (US);
Abstract
A method of identifying and localizing objects belonging to one of three or more classes, includes deriving vectors, each being mapped to one of the objects, where each of the vectors is an element of an N-dimensional space. The method includes training an ensemble of binary classifiers with a CISS technique, using an ECOC technique. For each object corresponding to a class, the method includes calculating a probability that the associated vector belongs to a particular class, using an ECOC probability estimation technique. In another embodiment, increased detection accuracy is achieved by using images obtained with different contrast methods. A nonlinear dimensional reduction technique, Kernel PCA, was employed to extract features from the multi-contrast composite image. The Kernel PCA preprocessing shows improvements over traditional linear PCA preprocessing possibly due to its ability to capture high-order, nonlinear correlations in the high dimensional image space.