The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Mar. 13, 2008
Tomoharu Suzuki, Anjo, JP;
Takashi Hiramaki, Nagoya, JP;
Jun Adachi, Obu, JP;
Kenichi Ohue, Toyota, JP;
Yuji Ninagawa, Aichi-ken, JP;
Kentaro Takahashi, Toyota, JP;
Shigeyasu Uozumi, Toyota, JP;
Satoru Nakanishi, Aichi-ken, JP;
Shinichi Kojima, Nisshin, JP;
Tomoharu Suzuki, Anjo, JP;
Takashi Hiramaki, Nagoya, JP;
Jun Adachi, Obu, JP;
Kenichi Ohue, Toyota, JP;
Yuji Ninagawa, Aichi-ken, JP;
Kentaro Takahashi, Toyota, JP;
Shigeyasu Uozumi, Toyota, JP;
Satoru Nakanishi, Aichi-ken, JP;
Shinichi Kojima, Nisshin, JP;
Aisin Seiki Kabushiki Kaisha, Aichi-ken, JP;
Toyota Jidosha Kabushiki Kaisha, Aichi-ken, JP;
Abstract
An eyelid detection apparatus includes a face-image storing apparatus for storing an image of a face of a subject, an eyelid-candidate extracting apparatus for processing the image stored in the face-image storing apparatus to extract a pair of lines, which becomes a candidate of a combination of a line corresponding to an upper eyelid and a line corresponding to a lower eyelid, a parameter calculating apparatus for calculating a parameter, which indicates a possibility that a pan of the image stored in the face-image storing apparatus, the part corresponding to the pair of lines extracted by the eyelid-candidate extracting apparatus, includes at least one of outer and inner corners of an eye, and an eyelid detecting apparatus for detecting a position of an eyelid of the subject on the basis of the parameter calculated by the parameter calculating apparatus.