The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7957502 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 07, 2011

Filed:

Oct. 01, 2008
Applicants:

Takahiro Manabe, Kanagawa-ken, JP;

Naruomi Akino, Tochigi-ken, JP;

Inventors:

Takahiro Manabe, Kanagawa-ken, JP;

Naruomi Akino, Tochigi-ken, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for scaling a scattered ray intensity distribution in a multi bulbs X-ray CT apparatus configured to irradiate a subject with X-rays from a plurality of X-ray generation sections, respectively and configure a cross-sectional image of the subject by detecting the X-rays passing through the subject. A first difference is achieved, the first difference being the difference between a real data of X-ray intensity achieved by passing of X-rays through the subject, the X-rays being radiated from the plurality of the X-ray generation sections, respectively and an opposed data of X-ray intensity achieved by passing of these X-rays through the subject at the same position in an opposite direction, a second difference between scattered ray intensity included in the real data and scattered ray intensity included in the opposed data being achieved. Primary scattered ray included in the real data of the X-ray intensity achieved by passing of the X-rays through the subject, the X-rays being radiated from the plurality of the X-ray generation sections, respectively are estimated. Primary scattered ray included in the opposed data of the X-ray intensity achieved by passing of the X-rays through the subject at the same position in an opposite direction, respectively, and performing scaling the primary estimated scattered ray intensity distribution on the basis of a ratio between the first difference and the second difference are estimated.


Find Patent Forward Citations

Manabe, Takahiro. (2011). Method for scaling scattered ray intensity distribution in multi bulbs x-ray ct and multi bulbs x-ray ct apparatus (U.S. Patent No. 7957502). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7957502

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