The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2011

Filed:

Apr. 13, 2010
Applicants:

Mihai Adrian Tiberiu Sanduleanu, Maastricht, NL;

Eduard Ferdinand Stikvoort, Eindhoven, NL;

Inventors:
Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03D 3/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A detector arrangement for detecting a frequency error between an input signal (DATA) and a reference signal. The detector arrangement comprising first latch circuitry (L, L) for sampling a quadrature component (CKQ) of the reference signal based on the input signal, to generate a first binary signal (PDQ); second latch circuitry (L, L) for sampling an in-phase component (CKI) of the reference signal based on the input signal, to-generate a second binary signal (PD I); third latch circuitry (L) for sampling the first binary signal based on the second binary signal, to generate the frequency error signal (FD). The detector further comprising control circuitry (TS) for selectively suppressing operation of a charge pump () to which the first binary signal (PDQ) is supplied, in response to a control signal derived from the second binary signal.


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