The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2011
Filed:
Mar. 21, 2007
Yu-yi Cheng, Taipei, TW;
Kou-cheng Yeh, Kaohsiung County, TW;
Chun-chen Chen, Hsinchu County, TW;
Teng-chun Wu, Hsinchu, TW;
Yu-Yi Cheng, Taipei, TW;
Kou-Cheng Yeh, Kaohsiung County, TW;
Chun-Chen Chen, Hsinchu County, TW;
Teng-Chun Wu, Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A symbol rate testing method based on signal waveform analysis is provided. A signal with a plurality of quasi bitsand a plurality of quasi bitsis received and sampled within an acquiring time. Maximum values of the quasi bitsare obtained by calculating sampling values of the signal at various sampling points. A minimum value among the maximum values is determined as a critical value. Whether a quasi bitis a bitor not is determined according to the critical value, and a total number of the bitswithin the acquiring time is counted. Similarly, a number of the bitswithin the acquiring time are also obtained. Thus, the symbol rate is obtained according to the above information.